Tootja osanumber : | 8V182512IDGGREP |
---|---|
RoHSi staatus : | Plii vaba / RoHS vastavuses |
Tootja / bränd : | Luminary Micro / Texas Instruments |
Varude seisukord : | 2101 pcs Stock |
Kirjeldus : | IC ABT SCAN TEST DEV3.3V 64TSSOP |
Laev alates : | Hongkong |
Andmelehed : | |
Saadetise tee : | DHL/Fedex/TNT/UPS/EMS |
Osa nr | 8V182512IDGGREP |
---|---|
Tootja | |
Kirjeldus | IC ABT SCAN TEST DEV3.3V 64TSSOP |
Lead Free status / RoHS staatus | Plii vaba / RoHS vastavuses |
Saadaval olev kogus | 2101 pcs |
Andmelehed | |
Toitepinge | 2.7 V ~ 3.6 V |
Pakkuja seadme pakett | 64-TSSOP |
Seeria | - |
Pakend | Tape & Reel (TR) |
Pakett / kott | 64-TFSOP (0.240", 6.10mm Width) |
Muud nimed | 296-22075-2 V62/04730-01XE |
Töötemperatuur | -40°C ~ 85°C |
Bitide arv | 18 |
Paigaldus tüüp | Surface Mount |
Niiskuse tundlikkuse tase (MSL) | 1 (Unlimited) |
Tootja Standardne pliiaeg | 42 Weeks |
Logic Type | ABT Scan Test Device With Universal Bus Transceivers |
Lead Free status / RoHS staatus | Lead free / RoHS Compliant |
Täpsem kirjeldus | ABT Scan Test Device With Universal Bus Transceivers IC 64-TSSOP |
Baasosa number | 74LVTH182512 |
IC REGISTERED BUFFER 160-TFBGA
IC TXRX NON-INVERT 3.6V 48SSOP
IC BUFFER 1.8V 25BIT SOT536-1
IC RECEIVER/DRVR ECL DIFF 8SOIC
LaosIC ABT SCAN TEST DEV 3.3V 64LQFP
IC ABT SCAN TEST DEV 3.3V 64LQFP
IC DRIVER QUAD DIFF PECL 16-SOIC
IC TXRX 8BIT TTL/BTL 52-QFP
IC SCAN-TEST-DEV/TXRX 64-LQFP
IC BUFFER 1.8V 25BIT SOT536